Resolution enhancement by applying MFM under UHV conditions

IEEE Transactions on Magnetics

Volumn 36, Issue 5 I, 2000, Pages 2975-2977

  Dreyer, M ^a   Gomez, R D ^a   Mayergoyz, I D ^a  

^a LABORATORY FOR PHYSICAL SCIENCES   (United States)

Author keywords

Magnetic force microscopy; Resolution; UHV

Indexed keywords

MAGNETIZATION; MICROSCOPIC EXAMINATION; OPTICAL RESOLVING POWER; SENSITIVITY ANALYSIS; SIGNAL TO NOISE RATIO; ULTRAHIGH VACUUM;

MAGNETIC FORCE MICROSCOPY (MFM);

MAGNETIC THICK FILMS;

EID: 0034260709     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.908645     Document Type: Article

References (5)