Detection of temperature sensitive defects using ZTC

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2004, Pages 185-190

  Long, Ethan ^a   Daasch, W Robert ^a   Madge, Robert ^b   Benware, Brady ^b  

^a PORTLAND STATE UNIVERSITY   (United States)

^b AGERE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GATE VOLTAGE; TEMPERATURE TESTING; VOLTAGE SHIFT; ZERO-TEMPERATURE-COEFFICIENT (ZTC);

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; ENERGY UTILIZATION; FREQUENCIES; FUNCTIONS; THRESHOLD VOLTAGE; TRANSISTORS;

LSI CIRCUITS;

EID: 3142714639     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2004.1299242     Document Type: Conference Paper

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