Laser Infrared Photothermal Radiometric and ELYMAT Characterizations of p-Si Wafers Annealed in the Presence of an External Electric Field

Physica Status Solidi (A) Applied Research

Volumn 185, Issue 2, 2001, Pages 471-478

  Mandelis, A ^a   Rodriguez, M E ^a,c   Raskin, Y ^b   Gorodokin, V ^b  

^a UNIVERSITY OF TORONTO   (Canada)

^b Sizary Ltd   (Israel)

^c INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038613418     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200106)185:2<471::AID-PSSA471>3.0.CO;2-L     Document Type: Article

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