Study of different type of dislocations in GaN thin films

Journal of Crystal Growth

Volumn 268, Issue 3-4 SPEC. ISS., 2004, Pages 484-488

  Yu, L P ^a   Shi, J Y ^a   Wang, Y Z ^a   Zhang, H ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

A1. Mobility; A1. Rocking curve; B1. GaN thin films

Indexed keywords

AMMONIA; CARRIER MOBILITY; DISLOCATIONS (CRYSTALS); GALLIUM NITRIDE; METALLORGANIC VAPOR PHASE EPITAXY; ULTRAVIOLET DETECTORS; X RAY DIFFRACTION ANALYSIS;

ROCKING CURVES; ULTRAVIOLET PHOTO DETECTORS;

THIN FILMS;

EID: 3142689026     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.04.077     Document Type: Conference Paper

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