-
1
-
-
0029765947
-
-
U. Schaedeli, E. Tinguely, A. J. Blakeney, P. Falcigno, and R. R. Kunz, Proc. SPIE, 2724, 344 (1996)
-
(1996)
Proc. SPIE
, vol.2724
, pp. 344
-
-
Schaedeli, U.1
Tinguely, E.2
Blakeney, A.J.3
Falcigno, P.4
Kunz, R.R.5
-
2
-
-
0032651668
-
-
J. B. Kim, H. Kim, S. H. Lee, S. J. Choi, and J. T. Moon, Proc. SPIE, 3678, 420 (1999)
-
(1999)
Proc. SPIE
, vol.3678
, pp. 420
-
-
Kim, J.B.1
Kim, H.2
Lee, S.H.3
Choi, S.J.4
Moon, J.T.5
-
3
-
-
0000582196
-
-
R. Sooriyakumaran, G. M. Wallaff, C. E. Larson, D. F. Alexander, R. A. DiPietro, J. Opitz, D. C. Hofer, D. C. LaTulipe Jr., J. P. Simons, K. E. Petrillo, K. Babich, M. Angelopoulos, Q. Lin, and A. Katnani, Proc. SPIE, 3333, 219 (1998)
-
(1998)
Proc. SPIE
, vol.3333
, pp. 219
-
-
Sooriyakumaran, R.1
Wallaff, G.M.2
Larson, C.E.3
Alexander, D.F.4
DiPietro, R.A.5
Opitz, J.6
Hofer, D.C.7
LaTulipe Jr., D.C.8
Simons, J.P.9
Petrillo, K.E.10
Babich, K.11
Angelopoulos, M.12
Lin, Q.13
Katnani, A.14
-
4
-
-
0032675482
-
-
P. Foster, T. Steinhausler, J. J. Biafore, G. Spaziano, S. G. Slater, and A. J. Blakeney, Proc. SPIE, 3678, 1034, (1999)
-
(1999)
Proc. SPIE
, vol.3678
, pp. 1034
-
-
Foster, P.1
Steinhausler, T.2
Biafore, J.J.3
Spaziano, G.4
Slater, S.G.5
Blakeney, A.J.6
-
5
-
-
0032674973
-
-
L. D. Boardman, C. R. Kessel, and S. J. Rhyner, Proc. SPIE, 3678, 562 (1999)
-
(1999)
Proc. SPIE
, vol.3678
, pp. 562
-
-
Boardman, L.D.1
Kessel, C.R.2
Rhyner, S.J.3
-
6
-
-
0000847419
-
-
R. Sooriyakumaran, D. Fenzel-Alexander, P. J. Brock, C. E. Larson, R. A. DiPietro, G. M. Wallraff, D. C Hoffer, and D. J. Dawson, Proc. SPIE, 3999, 1171 (2000)
-
(2000)
Proc. SPIE
, vol.3999
, pp. 1171
-
-
Sooriyakumaran, R.1
Fenzel-Alexander, D.2
Brock, P.J.3
Larson, C.E.4
DiPietro, R.A.5
Wallraff, G.M.6
Hoffer, D.C.7
Dawson, D.J.8
-
7
-
-
0034755502
-
-
R. Kwong, P. R. Varanasi, M. Lawson, T. Hughes, G. Jordhamo, M. Khojasteh, A. Mahorowala, R. Sooriyakumaran, P. Brock, C. Larson, D. Fenzel-Alexander, H. Truong, R. Allen, Proc. SPIE, 4345, 50 (2001)
-
(2001)
Proc. SPIE
, vol.4345
, pp. 50
-
-
Kwong, R.1
Varanasi, P.R.2
Lawson, M.3
Hughes, T.4
Jordhamo, G.5
Khojasteh, M.6
Mahorowala, A.7
Sooriyakumaran, R.8
Brock, P.9
Larson, C.10
Fenzel-Alexander, D.11
Truong, H.12
Allen, R.13
-
8
-
-
0035747311
-
-
T. S. Jean, T. T. Song, W. T. Jiaang, J. F. Chang, H. B. Cheng, C. S. Chuang, and T. Y. Lin, J. of Photopolymer Sci. and Technol. 14, (3), 503 (2001)
-
(2001)
J. of Photopolymer Sci. and Technol.
, vol.14
, Issue.3
, pp. 503
-
-
Jean, T.S.1
Song, T.T.2
Jiaang, W.T.3
Chang, J.F.4
Cheng, H.B.5
Chuang, C.S.6
Lin, T.Y.7
-
9
-
-
0000363030
-
-
S. Hien, G. Czech, W-D. Domke, H. Raske, M. Sebald, I. Stiebert, Proc SPIE, 3333, 154 (1998)
-
(1998)
Proc SPIE
, vol.3333
, pp. 154
-
-
Hien, S.1
Czech, G.2
Domke, W.-D.3
Raske, H.4
Sebald, M.5
Stiebert, I.6
-
10
-
-
0010250711
-
-
T. Morisawa, N. Matsuzawa, S. Mori, Y. Kaimoto, M. Endo, T. Ohfuji, K. Kuhara, and M. Sasago, J. Photopolymer Sci. and Technol., 10, (4), 589 (1997)
-
(1997)
J. Photopolymer Sci. and Technol.
, vol.10
, Issue.4
, pp. 589
-
-
Morisawa, T.1
Matsuzawa, N.2
Mori, S.3
Kaimoto, Y.4
Endo, M.5
Ohfuji, T.6
Kuhara, K.7
Sasago, M.8
-
11
-
-
0004044662
-
-
J. Hatakeyama, M. Nakashima, I. Kaneko, S. Nagura, and T. Ishihara, Proc. SIPE, 3333, 62 (1998)
-
(1998)
Proc. SIPE
, vol.3333
, pp. 62
-
-
Hatakeyama, J.1
Nakashima, M.2
Kaneko, I.3
Nagura, S.4
Ishihara, T.5
-
12
-
-
0034762602
-
-
R. Sooriyakumaran, D. Fenzel-Alexander, N. Fender, G. M. Wallraff, and R. D. Allen, Proc. SPIE, 4345, 319 (2001)
-
(2001)
Proc. SPIE
, vol.4345
, pp. 319
-
-
Sooriyakumaran, R.1
Fenzel-Alexander, D.2
Fender, N.3
Wallraff, G.M.4
Allen, R.D.5
-
13
-
-
85046911061
-
-
R. J. Hung, M. Yamachika, T. Chiba, H. Iwasawa, A. Hayashi, N. Yamahara, and T. Shimokawa, J. Photopolymer Sci. and Technol., 15, (4), 693 (2002)
-
(2002)
J. Photopolymer Sci. and Technol.
, vol.15
, Issue.4
, pp. 693
-
-
Hung, R.J.1
Yamachika, M.2
Chiba, T.3
Iwasawa, H.4
Hayashi, A.5
Yamahara, N.6
Shimokawa, T.7
-
14
-
-
3142580605
-
-
A1-RST11, Nov.
-
Y. Kawai, J. Hatakeyama, T. Takahashi and T. Ishihara, Int. SEMATECH 157nm Technical Data Review CD, A1-RST11, Nov., 15, (2000)
-
(2000)
Int. SEMATECH 157nm Technical Data Review CD
, pp. 15
-
-
Kawai, Y.1
Hatakeyama, J.2
Takahashi, T.3
Ishihara, T.4
-
15
-
-
0141499948
-
-
G. Barclay, S. Kanagasabapathy, G. Pohlers, J. Mattia, K. Xiong, S. Ablaza, J. Cameron, A. Zampini, T. Zhang, S. Yamada, F. Huby and K. Wiley, Proc SPIE, 5039, 433 (2003)
-
(2003)
Proc SPIE
, vol.5039
, pp. 433
-
-
Barclay, G.1
Kanagasabapathy, S.2
Pohlers, G.3
Mattia, J.4
Xiong, K.5
Ablaza, S.6
Cameron, J.7
Zampini, A.8
Zhang, T.9
Yamada, S.10
Huby, F.11
Wiley, K.12
-
16
-
-
0141499938
-
-
E. Tegou, V. Bellas, E. Gogolides, P. Argitis, K. Dean, D. Eon, G. Cartry, and C. Cardinaud, Proc SPIE, 5039, 453 (2003)
-
(2003)
Proc SPIE
, vol.5039
, pp. 453
-
-
Tegou, E.1
Bellas, V.2
Gogolides, E.3
Argitis, P.4
Dean, K.5
Eon, D.6
Cartry, G.7
Cardinaud, C.8
-
19
-
-
0024662717
-
-
R. Leuchner, R. Sezi, M. Sebald, G. Czech and D. Stephani, Microelectron. Eng., 9, 547 (1989)
-
(1989)
Microelectron. Eng.
, vol.9
, pp. 547
-
-
Leuchner, R.1
Sezi, R.2
Sebald, M.3
Czech, G.4
Stephani, D.5
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