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Volumn 247, Issue 1-3, 2005, Pages 28-36

Semi-quantitative characterisation of binary salt mixtures with static secondary ion mass spectrometry (S-SIMS)

Author keywords

Binary salts; Mixtures; Polyatomic; Quantification; Sample preparation; Static SIMS

Indexed keywords


EID: 27744519947     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2005.07.010     Document Type: Article
Times cited : (4)

References (13)
  • 6
    • 0004123702 scopus 로고    scopus 로고
    • J. Vickerman D. Briggs IM Publications and Surface Spectra Limited Chichester and Manchester
    • A. Benninghoven J. Vickerman D. Briggs TOF-SIMS: Surface Analysis by Mass Spectrometry 2001 IM Publications and Surface Spectra Limited Chichester and Manchester 41
    • (2001) TOF-SIMS: Surface Analysis by Mass Spectrometry , pp. 41
    • Benninghoven, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.