Comparison of Ga+ and SF5+ primary ions for the molecular speciation of oxysalts in static secondary ion mass spectrometry (S-SIMS)

Journal of Analytical Atomic Spectrometry

Volumn 20, Issue 10, 2005, Pages 1088-1094

  Van Ham, Rita ^a   Van Vaeck, Luc ^a   Adams, Freddy ^a   Adriaens, Annemie ^b  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM; MASS SPECTROMETRY; MOLECULAR STRUCTURE; SALTS;

MOLECULAR COMPOSITION; MOLECULAR SPECIFITY; SECONDARY ION-MASS SPECTROMETRY (SIMS); SPECIATION;

INORGANIC COMPOUNDS;

EID: 27144516796     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/b506163f     Document Type: Article

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