Characterization and modeling of thermal effects in sub-micron InP DHBTs

Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC

Volumn , Issue , 2005, Pages 65-68

  Li, James Chingwei ^a,b   Hussain, Tahir ^a   Hitko, Donald A ^a   Asbeck, Peter M ^b   Sokolich, Marko ^a  

^a Hughes Aircraft Co   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

HBT; InP; Thermal modeling

Indexed keywords

CHARACTERIZATION; DATA REDUCTION; INTEGRATED CIRCUITS; PARAMETER ESTIMATION; SEMICONDUCTING INDIUM PHOSPHIDE; THERMAL EFFECTS;

EMITTERS; INP; TEMPERATURE DEPENDENCE; THERMAL MODELING;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 30944463843     PISSN: 15508781     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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