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Volumn , Issue , 2004, Pages 553-556

First demonstration of sub-0.25μm-width emitter InP-DHBTs with >400 GHz f t and >400 GHz f max

Author keywords

[No Author keywords available]

Indexed keywords

DHBT; EMITTERS; SCANNING ELECTRON MICROGRAPHS (SEM); TRADEOFFS; EMITTER DEVICES; EMITTER RESISTANCE; EMITTER-BASE JUNCTIONS; INP-DHBT; LOW-POWER CONSUMPTION; LOWER-POWER CONSUMPTION; METAL WIDTH; PERFORMANCE; SCALINGS; STATE OF THE ART;

EID: 21644435770     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (35)

References (8)
  • 2
    • 6644225001 scopus 로고    scopus 로고
    • Submicron scaling of HBTs
    • Nov
    • M. J. W. Rodwell, "Submicron Scaling of HBTs", IEEE Trans. On Electron Devices, Vol.48, N0. 11, Nov 2001 pp. 2606-2624
    • (2001) IEEE Trans. on Electron Devices , vol.48 , Issue.11 , pp. 2606-2624
    • Rodwell, M.J.W.1
  • 3
    • 21644476213 scopus 로고    scopus 로고
    • Patterned n+ implant into InP substrates for HBT subcollector
    • Accepted for publication in
    • M. Chen, et al., "Patterned n+ Implant into InP Substrates for HBT Subcollector," Accepted for publication in IEEE Transaction of Electron Devices.
    • IEEE Transaction of Electron Devices
    • Chen, M.1
  • 5
    • 2442424247 scopus 로고    scopus 로고
    • InGaAs-InP MESA DHBTs with simultaneously high Ft and Fmax and low Ccb/Ic ratio
    • May
    • Z Griffith et al., "InGaAs-InP MESA DHBTs With Simultaneously High Ft and Fmax and Low Ccb/Ic Ratio," IEEE Electron Device Letters, May 2004, pp 250-252
    • (2004) IEEE Electron Device Letters , pp. 250-252
    • Griffith, Z.1
  • 6
    • 21644458613 scopus 로고    scopus 로고
    • Effects of device design on the thermal properties of InP-based HBTs
    • J.C. Li, et al., "Effects of device design on the thermal properties of InP-based HBTs," International Symposium on Compound Semiconductors Digest, 2003, pp. 205-206.
    • (2003) International Symposium on Compound Semiconductors Digest , pp. 205-206
    • Li, J.C.1
  • 7
    • 1942487874 scopus 로고    scopus 로고
    • Thermal Limitations of InP HBTs in 80- and 160-Gb ICs
    • April
    • I. Harrison, et al., "Thermal Limitations of InP HBTs in 80- and 160-Gb ICs," IEEE Trans. Electron Devices, April 2004, pp. 529-534
    • (2004) IEEE Trans. Electron Devices , pp. 529-534
    • Harrison, I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.