Advanced electrical and stability characterization of untrimmed and variously trimmed thick-film and LTCC resistors

Microelectronics Reliability

Volumn 46, Issue 2-4, 2006, Pages 352-359

  Dziedzic, Andrzej ^a   Kolek, Andrzej ^b   Ehrhardt, Waleed ^c   Thust, Heiko ^c  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b RZESZOW UNIVERSITY OF TECHNOLOGY   (Poland)

^c ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC NOISE; AGING OF MATERIALS; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; ELECTRICAL ENGINEERING; EMBEDDED SYSTEMS; STABILITY CRITERIA;

LASER TRIMMED UNGLAZED THICK-FILM RESISTORS; LTCC RESISTORS; MICRORESISTORS; THERMAL AGEING; VOLTAGE PULSE TRIMMED;

THICK FILM CIRCUITS;

EID: 30844443965     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.12.014     Document Type: Article

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