High-voltage pulse stressing of thick-film resistors and noise

Microelectronics Reliability

Volumn 43, Issue 6, 2003, Pages 905-911

  Stanimirovic I ^a   Jevtic M M ^b   Stanimirovic Z ^a  

^a IRITEL Telecommunications and Electronics Institute   (Yugoslavia)

^b UNIVERSITY OF BELGRADE   (Serbia)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; MICROSTRUCTURE; RESISTORS;

PULSE STRESSING;

THICK FILM DEVICES;

EID: 0038824189     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(03)00094-5     Document Type: Conference Paper

References (10)

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