A random resistor network model of voltage trimming

Journal of Physics D: Applied Physics

Volumn 37, Issue 15, 2004, Pages 2170-2174

  Grimaldi, C ^a   Maeder, T ^a,b   Ryser, P ^a   Strassler S ^a,b  

^a EPFL   (Switzerland)

^b Sensile Technologies SA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ASYMPTOTIC STABILITY; ELECTRIC RESISTANCE; ELECTROMIGRATION; GLASS; INDUSTRIAL APPLICATIONS; LASER APPLICATIONS; MATHEMATICAL MODELS; MICROCRACKS; POLYSILICON; TRIMMING;

PERCOLATION EFFECTS; RESISTOR NETWORK MODELS; VOLTAGE DISCHARGE; VOLTAGE TRIMMING;

RESISTORS;

EID: 3843104644     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/37/15/019     Document Type: Article

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