-
2
-
-
0026883244
-
-
X. Ye, M. D. Bonte, J. P. Celis, and J. R. Roos, J. Electrochem. Soc., 139, 1592 (1992).
-
(1992)
J. Electrochem. Soc.
, vol.139
, pp. 1592
-
-
Ye, X.1
Bonte, M.D.2
Celis, J.P.3
Roos, J.R.4
-
3
-
-
30644478881
-
-
M. Matsuoka, S. Ito, and T. Hayashi, Kinzoku Hyomen Gijutsu, 33, 385 (1982).
-
(1982)
Kinzoku Hyomen Gijutsu
, vol.33
, pp. 385
-
-
Matsuoka, M.1
Ito, S.2
Hayashi, T.3
-
6
-
-
0022129784
-
-
D. Anderson, R. Haak, C. Pgden, D. Tench, and J. White, J. Appl. Electrochem., 15, 631 (1985).
-
(1985)
J. Appl. Electrochem.
, vol.15
, pp. 631
-
-
Anderson, D.1
Haak, R.2
Pgden, C.3
Tench, D.4
White, J.5
-
8
-
-
0024639560
-
-
S. Nakahara, Y. Okinaka, and H. K. Straschil, J. Electrochem. Soc., 136, 1120 (1989).
-
(1989)
J. Electrochem. Soc.
, vol.136
, pp. 1120
-
-
Nakahara, S.1
Okinaka, Y.2
Straschil, H.K.3
-
12
-
-
30644462550
-
-
H. J. Read, Plating, 49, 602 (1962).
-
(1962)
Plating
, vol.49
, pp. 602
-
-
Read, H.J.1
-
13
-
-
0037394443
-
-
H. Lee, S. S. Wong, and S. D. Lopatin, J. Appl. Phys., 93, 3796 (2003).
-
(2003)
J. Appl. Phys.
, vol.93
, pp. 3796
-
-
Lee, H.1
Wong, S.S.2
Lopatin, S.D.3
-
14
-
-
9744230633
-
-
H. Lee, W. D. Nix, and S. S. Wong, J. Vac. Sci. Technol. B, 22, 2369 (2004).
-
(2004)
J. Vac. Sci. Technol. B
, vol.22
, pp. 2369
-
-
Lee, H.1
Nix, W.D.2
Wong, S.S.3
-
15
-
-
2942517838
-
-
V. A. Vas'ko, I. Tabakovic, S. C. Riemer, and M. T. Kief, Microelectron. Eng., 75, 71 (2004).
-
(2004)
Microelectron. Eng.
, vol.75
, pp. 71
-
-
Vas'Ko, V.A.1
Tabakovic, I.2
Riemer, S.C.3
Kief, M.T.4
-
16
-
-
0038167609
-
-
V. A. Vas'ko, I. Tabakovic, and S. C. Riemer, Electrochem. Solid-State Lett., 6, C100 (2003).
-
(2003)
Electrochem. Solid-State Lett.
, vol.6
, pp. 100
-
-
Vas'Ko, V.A.1
Tabakovic, I.2
Riemer, S.C.3
-
17
-
-
0034514230
-
-
T. P. Moffat, D. Wheeler, C. Witt, and D. Josell, J. Electrochem. Soc., 147, 4524 (2000).
-
(2000)
J. Electrochem. Soc.
, vol.147
, pp. 4524
-
-
Moffat, T.P.1
Wheeler, D.2
Witt, C.3
Josell, D.4
-
20
-
-
0033279220
-
-
Q.-T. Jiang, M. E. Thomas, G. Bersuker, B. Foran, R. Mikkola, B. Carpenter, and J. Ormando, Mater. Res. Soc. Symp. Proc., 564, 429 (1999).
-
(1999)
Mater. Res. Soc. Symp. Proc.
, vol.564
, pp. 429
-
-
Jiang, Q.-T.1
Thomas, M.E.2
Bersuker, G.3
Foran, B.4
Mikkola, R.5
Carpenter, B.6
Ormando, J.7
-
22
-
-
0037349002
-
-
J. M. Paik, Y.-J. Park, M.-S. Yoon, J.-H. Lee, and Y.-C. Joo, Scr. Mater., 48, 683 (2003).
-
(2003)
Scr. Mater.
, vol.48
, pp. 683
-
-
Paik, J.M.1
Park, Y.-J.2
Yoon, M.-S.3
Lee, J.-H.4
Joo, Y.-C.5
-
23
-
-
0842301327
-
-
K. Pantleon, J. A. D. Jensen, and M. A. J. Somers, J. Electrochem. Soc., 151, C45 (2004).
-
(2004)
J. Electrochem. Soc.
, vol.151
, pp. 45
-
-
Pantleon, K.1
Jensen, J.A.D.2
Somers, M.A.J.3
-
25
-
-
18344390672
-
-
M. Hasegawa, Y. Negishi, T. Nakanishi, and T. Osaka, J. Electrochem. Soc., 152, C221 (2005).
-
(2005)
J. Electrochem. Soc.
, vol.152
, pp. 221
-
-
Hasegawa, M.1
Negishi, Y.2
Nakanishi, T.3
Osaka, T.4
-
26
-
-
0037012504
-
-
M.-S. Yoon, Y.-J. Park, and Y.-C. Joo, Thin Solid Films, 408, 230 (2002).
-
(2002)
Thin Solid Films
, vol.408
, pp. 230
-
-
Yoon, M.-S.1
Park, Y.-J.2
Joo, Y.-C.3
-
27
-
-
0036498358
-
-
L. T. Koh, G. Z. You, C. Y. Li, and P. D. Foo, Microelectron. J., 33, 229 (2002).
-
(2002)
Microelectron. J.
, vol.33
, pp. 229
-
-
Koh, L.T.1
You, G.Z.2
Li, C.Y.3
Foo, P.D.4
-
28
-
-
0001325323
-
-
S. H. Brongersma, E. Richard, I. Vervoort, H. Bender, W. Vandervorst, S. Laglrange, G. Beyer, and K. Maex, J. Appl. Phys., 86, 3642 (1999).
-
(1999)
J. Appl. Phys.
, vol.86
, pp. 3642
-
-
Brongersma, S.H.1
Richard, E.2
Vervoort, I.3
Bender, H.4
Vandervorst, W.5
Laglrange, S.6
Beyer, G.7
Maex, K.8
-
29
-
-
0033640274
-
-
S. Lagrange, S. H. Brongersma, M. Judelewicz, A. Saerens, I. Vervoort, E. Richard, R. Palmans, and K. Maex, Microelectron. Eng., 50, 449 (2000).
-
(2000)
Microelectron. Eng.
, vol.50
, pp. 449
-
-
Lagrange, S.1
Brongersma, S.H.2
Judelewicz, M.3
Saerens, A.4
Vervoort, I.5
Richard, E.6
Palmans, R.7
Maex, K.8
-
31
-
-
0017494062
-
-
S. Nakahara, Y. Okinaka, and D. R. Turner, J. Test. Eval., 5, 178 (1977).
-
(1977)
J. Test. Eval.
, vol.5
, pp. 178
-
-
Nakahara, S.1
Okinaka, Y.2
Turner, D.R.3
-
32
-
-
0032620394
-
-
J. M. E. Harper, C. Cabral, Jr., P. C. Andricacos, L. Gignac, I. C. Naoyan, and K. P. Rodbell, J. Appl. Phys., 86, 2516 (1999).
-
(1999)
J. Appl. Phys.
, vol.86
, pp. 2516
-
-
Harper, J.M.E.1
Cabral Jr., C.2
Andricacos, P.C.3
Gignac, L.4
Naoyan, I.C.5
Rodbell, K.P.6
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