Size and shape controlled growth of molecular nanostructures on silicon oxide templates

Nano Letters

Volumn 4, Issue 6, 2004, Pages 1115-1119

  Garcia, Ricardo ^a   Tello, Marta ^a   Moulin, Jean François ^b   Biscarini, Fabio ^b  

^a INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

^b CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ORGANIC COMPOUND; SILICON DIOXIDE;

ARTICLE; BIOENGINEERING; CHEMICAL STRUCTURE; ELECTRIC ACTIVITY; ELECTRODE; KINETICS; METALLATION; METALLURGY; MOLECULAR MECHANICS; NANOPARTICLE; NANOTECHNOLOGY; OXIDATION; STRUCTURE ANALYSIS; SURFACE PROPERTY;

EID: 3042792691     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl049544f     Document Type: Article

References (25)

1. Sirringhaus, H.; Shimoda, T., Guest Editors, MRS Bull. 2003, 28, 802-842.
2. Leufgen, M.; Lebib, A.; Muck, T.; Bass, U.; Wagner, V.; Borzenko, T.; Schmidt, G.; Geurts, J.; Molenkamp, L. W. Appl. Phys. Lett. 2004, 84, in press.
3. Stutzmann, N.; Friend, R. H.; Sirringhaus, H. Science 2003, 1881-1884.
4. Austin, M. D.; Chou, S. Y. Appl. Phys. Lett. 2002, 81, 4431-4433.
5. Rogers, J. A.; Bao, Z.; Makhija, A.; Braun, P. Adv. Mater. 1999, 11, 741-745.
6. Matters, M.; de Leeuw, D. M.; Vissenberg, M. J. C. M.; Hart, C. M.; Herwig, P. T.; Geuns, T.; Mutsaers, C. M. J.; Drury, C. J. Opt. Mater. 1999, 12, 189-197.
7. Dinelli, F.; Murgia, M.; Cavallini, M.; Levy, P.; Biscarini, F.; De Leeuw, D. M. Phys. Rev. Lett. 2004, in press.
8. Dediu, V.; Murgia, M.; Matacotta, F. C.; Taliani, C.; Barbanera, S. Solid State Commun. 2002, 122, 181-184.
9. Shaheen, S. E.; Brabec, C. J.; Sariciftci, N. S.; Padinger, F.; Fromherz, T.; Hummelen, J. C. Appl. Phys. Lett. 2001, 78, 841-843.
10. Brinkmann, M.; Graff, S.; Biscarini, F. Phys. Rev. B 2002, 66, 165430-1-165430-8.
11. Dagata, J. A. Science 1995, 270, 1625.
12. Garcia, R.; Calleja, M.; Rohrer, H. J. Appl. Phys. 1999, 86, 1898-1903.
13. Gomez-Moñivas, S.; Saenz, J. J.; Calleja, M.; Garcia, R. Phys. Rev. Lett. 2003, 91, 56101-56104.
14. Tello, M.; Garcia, R. Appl. Phys. Lett. 2001, 79, 424-426.
15. Hoeppener, S.; Maoz, R.; Sagiv, J. Nano Lett. 2003, 3, 761-767.
16. Cavallini, M.; Mei, P.; Biscarini, F.; Garcia, R. Appl. Phys. Lett. 2003, 83, 5286-5288.
17. Muccini, M.; Murgia, M.; Biscarini, F.; Taliani, C. Adv. Mater. 2001, 13, 355-358.
18. Varabais, A. L.; Stanley, H. E. Fractals concepts in surface growth; Cambridge University Press: Cambridge, 1995.
19. Horowitz, G.; Bachet, B.; Yassar, A.; Lang, P.; Demanze, F.; Fave, J. L.; Garnier, F. Chem. Mater. 1995, 7, 1337-1341.
20. Porzio, W.; Destri, S.; Mascherpa, M.; Bruckner, S. Acta Polym, 1993, 44, 266-272.
21. Taliani, C.; Biscarini, F.; Muccini, M. In Conjugated Oligomers, Polymers, and Dendrimers: from Polyacetylene to DNA; Hadzioannou, G., Van Hutten, P. F., Eds.; Wiley VCH: New York, 1999; Chapter 6, p 149.
22. Böhme, O.; Ziegler, Ch.; Göpel, W. Synth. Met. 1994, 67, 87-92.
23. Synchrotron X-ray reflectometry measurements performed on sexithienyl ultrathin films on silicon oxide show the formation of a so-called thin film phase at the early stages of growth, with molecules standing perpendicular to the substrate; at later stages (≫ 1 ML) a bulk phase is formed, with molecules tilted by 23° with respect to the normal axis to the substrate.
24. Sirringhaus, H.; Brown, P. J.; Friend, R. H.; Nielsen, M. M.; Bechaard, K.; Langeveld-Voss, B. M. W.; Spiering, A. J. H.; Janssen, R. A. J.; Meijer, E. W.; Herwig, P.; de Leeuw, D. M. Nature 1999, 401, 685-688.
25. Dagata, J. A.; Inoue, T.; Itoh, J.; Matsumoto, K.; Yokoyama, H. J. Appl. Phys. 1998, 84, 6891-6900.