Cation mass spectrometry: Towards an optimisation of SIMS analyses performed in the MCsx+ mode

Spectroscopy Europe

Volumn 15, Issue 4, 2003, Pages

  Wirtz, T ^a   Migeon, H N ^a  

^a LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY   (Luxembourg)

Author keywords

[No Author keywords available]

Indexed keywords

ALKALINE EARTH METALS; CESIUM; CHEMICAL ANALYSIS; COMPOSITION; EVAPORATION; ION BOMBARDMENT; ION SOURCES; IONIZATION; OXIDES; SILICON; SINGLE CRYSTALS; TEMPERATURE;

CATION MASS SPECTROMETRY; MAGNETIC SECTOR SPECTROMETER;

SECONDARY ION MASS SPECTROMETRY;

EID: 3042842715     PISSN: 09660941     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (4)

1. T. Wirtz, H.-N. Migeon and H. Scherrer, Int. J. Mass Spectrom. 225(2), 135 (2003).
2. T. Wirtz, H.-N. Migeon and H. Scherrer, Appl. Surf. Sci. 203-204, 189 (2003).
3. T. Mootz, B. Rasser, P. Sudraud, E. Niehuis, T. Wirtz, W. Bieck and H.-N. Migeon, in Secondary Ion Mass Spectrometry SIMS XII, Ed by A. Benninghoven, P. Bertrand, H.-H. Migeon and H.W. Werner. Elsevier, Amsterdam, p. 233 (2000).
4. T. Wirtz, B. Duez, H.-N. Migeon and H. Scherrer, Int. J. Mass Spectrom. 209, 57 (2001).