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Volumn 84, Issue 24, 2004, Pages 5031-5033

Interfacial interactions at Au/Si3N4/Si(111) and Ni/Si3N4/Si(111) structures with ultrathin nitride films

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; CRYSTAL STRUCTURE; DEGRADATION; DIELECTRIC MATERIALS; DIFFUSION; GOLD; INTERFACES (MATERIALS); NICKEL; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SILICON NITRIDE; SYNCHROTRONS;

EID: 3042733119     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1763636     Document Type: Article
Times cited : (17)

References (18)
  • 8
    • 0037438265 scopus 로고    scopus 로고
    • and references therein
    • J. E. Kim and H. W. Yeom, Phys. Rev. B 67, 035304 (2003), and references therein.
    • (2003) Phys. Rev. B , vol.67 , pp. 035304
    • Kim, J.E.1    Yeom, H.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.