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Volumn 84, Issue 24, 2004, Pages 5031-5033
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Interfacial interactions at Au/Si3N4/Si(111) and Ni/Si3N4/Si(111) structures with ultrathin nitride films
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL LATTICES;
CRYSTAL STRUCTURE;
DEGRADATION;
DIELECTRIC MATERIALS;
DIFFUSION;
GOLD;
INTERFACES (MATERIALS);
NICKEL;
PHOTOELECTRON SPECTROSCOPY;
PHOTOEMISSION;
SILICON NITRIDE;
SYNCHROTRONS;
INTERFACIAL REACTIONS;
ROOM TEMPERATURE;
SCANNING PHOTOEMISSION MICROSCOPES (SPEM);
SYNCHROTRON PHOTOEMISSION SPECTROMICROSCOPY;
ULTRATHIN FILMS;
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EID: 3042733119
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1763636 Document Type: Article |
Times cited : (17)
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References (18)
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