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Volumn 200, Issue , 2003, Pages 79-84
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Spectro-microscopy of ultra-thin SiN films on Si ( 1 1 1 )
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Author keywords
ESCA; Photoemission microscopy; Thin film growth
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Indexed keywords
ATTENUATION;
COMPOSITION;
FILM GROWTH;
PHOTOEMISSION;
SILICON NITRIDE;
SPECTROSCOPIC ANALYSIS;
STOICHIOMETRY;
SURFACE ROUGHNESS;
PHOTOEMISSION MICROSCOPY;
ULTRATHIN FILMS;
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EID: 0037244746
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(02)01678-6 Document Type: Conference Paper |
Times cited : (8)
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References (16)
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