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Volumn 200, Issue , 2003, Pages 79-84

Spectro-microscopy of ultra-thin SiN films on Si ( 1 1 1 )

Author keywords

ESCA; Photoemission microscopy; Thin film growth

Indexed keywords

ATTENUATION; COMPOSITION; FILM GROWTH; PHOTOEMISSION; SILICON NITRIDE; SPECTROSCOPIC ANALYSIS; STOICHIOMETRY; SURFACE ROUGHNESS;

EID: 0037244746     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)01678-6     Document Type: Conference Paper
Times cited : (8)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.