Ballistic-electron-emission-microscopy studies on-type Si(100) and-type Si(100) structures with very thin oxides

Physical Review B - Condensed Matter and Materials Physics

Volumn 57, Issue 11, 1998, Pages 6623-6628

  Quattropani, Lidia ^a   Maggio Aprile, Ivan ^a   Niedermann, Philippe ^a   Fischer, Øystein ^a  

^a UNIVERSITY OF GENEVA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000123113     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.57.6623     Document Type: Article

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