Chemical characterization of surfaces and interfaces with submicron spatial resolution

Surface and Interface Analysis

Volumn 30, Issue 1, 2000, Pages 464-471

  Kiskinova, M P ^a  

^a SINCROTRONE TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL IMAGING; SYNCHROTRON RADIATION SCANNING PHOTOELECTRON MICROSCOPY;

INTERFACES (MATERIALS);

EID: 0034244745     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200008)30:1<464::AID-SIA712>3.0.CO;2-H     Document Type: Article

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