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Volumn 40, Issue 12, 2004, Pages 771-772

AlGaN/InGaN HEMTs for RF current collapse suppression

Author keywords

[No Author keywords available]

Indexed keywords

HETEROJUNCTIONS; HIGH ELECTRON MOBILITY TRANSISTORS; LIGHT EMITTING DIODES; MOLECULAR BEAM EPITAXY; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; TRANSCONDUCTANCE;

EID: 3042638789     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20040398     Document Type: Article
Times cited : (30)

References (11)
  • 1
    • 0038577082 scopus 로고    scopus 로고
    • Millimeter-wave high-power 0.25-μm gate-length AlGaN/GaN HEMTs on SiC substrates
    • Schwindt, R.S., et al.: 'Millimeter-wave high-power 0.25-μm gate-length AlGaN/GaN HEMTs on SiC substrates', IEEE Microw. Wirel Compon. Lett., 2003, 13, pp. 93-95
    • (2003) IEEE Microw. Wirel Compon. Lett. , vol.13 , pp. 93-95
    • Schwindt, R.S.1
  • 2
    • 0032659622 scopus 로고    scopus 로고
    • Enhanced electron mobility in AlGaN/InGaN/AlGaN double heterostructures by piezoelectric effect
    • Maeda, N., et al.: 'Enhanced electron mobility in AlGaN/InGaN/AlGaN double heterostructures by piezoelectric effect', Jpn., J. Appl. Phys., 1999, 38, (7B), pp. L799-L801
    • (1999) Jpn., J. Appl. Phys. , vol.38 , Issue.7 B
    • Maeda, N.1
  • 3
    • 0242468756 scopus 로고    scopus 로고
    • Surface stability of InGaN-channel based HFETs
    • Neuburger, M., et al.: 'Surface stability of InGaN-channel based HFETs', Electron. Lett., 2003, 39, (22), pp. 1614-1616
    • (2003) Electron. Lett. , vol.39 , Issue.22 , pp. 1614-1616
    • Neuburger, M.1
  • 4
    • 0005985130 scopus 로고    scopus 로고
    • GaN: Processing, defects, and devices
    • Pearton, S.J., et al.: 'GaN: processing, defects, and devices', J. Appl. Phys., 1999, 86, pp. 1-78
    • (1999) J. Appl. Phys. , vol.86 , pp. 1-78
    • Pearton, S.J.1
  • 5
    • 0035517506 scopus 로고    scopus 로고
    • AlGaN/InGaN/GaN double heterostmcture field-effect transistor
    • Simin, G., et al.: 'AlGaN/InGaN/GaN double heterostmcture field-effect transistor', Jpn. J. Appl. Phys., 2001, 40, (11A), pp. L1142-L1144
    • (2001) Jpn. J. Appl. Phys. , vol.40 , Issue.11 A
    • Simin, G.1
  • 6
    • 0035505401 scopus 로고    scopus 로고
    • Device characteristics of the GaN/InGaN-doped channel HFETs
    • Hsin, Y.-M., et al.: 'Device characteristics of the GaN/InGaN-doped channel HFETs', IEEE Electron Device Lett., 2001, 22, (1), pp. 501-503
    • (2001) IEEE Electron Device Lett. , vol.22 , Issue.1 , pp. 501-503
    • Hsin, Y.-M.1
  • 7
    • 0036679147 scopus 로고    scopus 로고
    • Thermally-stable low-resistance Ti/Al/Mo/Au multiplayer ohmic contacts on n-GaN
    • Kumar, V., et al.: 'Thermally-stable low-resistance Ti/Al/Mo/Au multiplayer ohmic contacts on n-GaN', J. Appl. Phys., 2002, 92, pp. 1712-1714
    • (2002) J. Appl. Phys. , vol.92 , pp. 1712-1714
    • Kumar, V.1
  • 8
    • 0242552302 scopus 로고    scopus 로고
    • High performance 0.25 μm gate-length AlGaN/GaN HEMTs on 6H-SiC with power density of 6.7 W/mm at 18 GHz
    • Kumar, V., et al.: 'High performance 0.25 μm gate-length AlGaN/GaN HEMTs on 6H-SiC with power density of 6.7 W/mm at 18 GHz', Electron. Lett., 2003, 39, (22), pp. 1609-1610
    • (2003) Electron. Lett. , vol.39 , Issue.22 , pp. 1609-1610
    • Kumar, V.1
  • 9
    • 0036068528 scopus 로고    scopus 로고
    • AlGaN/GaN HFET amplifier performance and limitations
    • Trew, R.J.: 'AlGaN/GaN HFET amplifier performance and limitations', IEEE MTT-S Int. Microw. Symp. Dig., 2003, 3, pp. 1811-1814
    • (2003) IEEE MTT-S Int. Microw. Symp. Dig. , vol.3 , pp. 1811-1814
    • Trew, R.J.1
  • 10
    • 1242272647 scopus 로고    scopus 로고
    • Accent Optical Technologies Inc.: 'DIVA user manual', 2001
    • (2001) DIVA User Manual
  • 11
    • 0035278804 scopus 로고    scopus 로고
    • The impact of surface states on the DC and RF characteristics of AlGaN/GaN HFETs
    • Vetury, R., et al.: 'The impact of surface states on the DC and RF characteristics of AlGaN/GaN HFETs', IEEE Trans. Electron Devices, 2001, 48, (3), pp. 560-566
    • (2001) IEEE Trans. Electron Devices , vol.48 , Issue.3 , pp. 560-566
    • Vetury, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.