SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 92, Issue 3-4, 2002, Pages 111-132

Determination of crystal polarity from bend contours in transmission electron microscope images

(1) Spiecker, E a

a UNIVERSITY OF KIEL (Germany)

Author keywords

Bend contours; CBED; Crystal polarity; Dynamical electron diffraction

Indexed keywords

COMPUTER SIMULATION; DISLOCATIONS (CRYSTALS); ELECTRON DIFFRACTION; INTERFACES (MATERIALS); SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

CONVERGENT BEAM ELECTRON DIFFRACTION (CBED);

CRYSTAL STRUCTURE;

GALLIUM ARSENIDE; ZINC SULFIDE;

ARTICLE; ASSAY; BEND CONTOUR; CONTRAST; CONTROLLED STUDY; CRYSTAL; DYNAMICS; ELECTRON DIFFRACTION; ELECTRON MICROSCOPE; IMAGE ANALYSIS; PHYSICAL PHENOMENA; POLARITY; RADIATION SCATTERING; SAMPLE; SIMULATION; TECHNIQUE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036297996 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(02)00072-4 Document Type: Article

Times cited : (16)

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