Characteristics of ferroelectric in the Au/Sr0.25Ba0.75Nb2O6 /Si structure by C-V measurement

Journal of the Korean Physical Society

Volumn 42, Issue SUPPL., 2003, Pages

  Ryu, M K ^a   Lee, S H ^a   Kim, J P ^a,b   Jang, M S ^a  

^a Pusan National University   (South Korea)

^b Korea Basic Science Institute (KBSI)   (South Korea)

Author keywords

NvRAMs; Sr0.25Ba0.75Nb2O6 thin films

Indexed keywords

EID: 2942651955     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (14)

1. J. F. Scott and C. A. Paz de Araujo, Science 246, 1400 (1989).
2. C. A. Paz de Araujo, J. D. Cuchiaro, L. D. McMillan, M. C. Scott and J. F. Scott, Nature (London) 374, 627 (1995).
3. S. B. Desu, H. S. Cho and P. C. Joshi, Appl. Phys. Lett. 70, 1393 (1997).
4. Y. Shichi, S. Tanimoto, T. Goto, K. Kuroiwa and Y. Tarui, Jpn. J. Appl. Phys. 33, 5172 (1994).
5. M. W. J. Prins, S. E. Zinnermers, J. F. M. Cillessen and J. B. Giesbers, Appl. Phys. Lett. 70, 458 (1997).
6. T. Choi, Y. Kim and J. Lee, J. Korean Phys. Soc. 40, 188 (2002).
7. Shin JG, Shin H and Jeon JU, J. Korean Phys. Soc. 40, 145 (2002).
8. Hushur A, Ko JH, Kojima S, Lee SS and Jang MS, J. Korean Phys. Soc. 41, 763 (2002).
9. Choi MK, Jeon BG, Song YJ and Kim K, J. Korean Phys. Soc. 40, 697 (2002).
10. Choi HS, Park KS, Hur JS, Choi IH, Kim YT and Kim SI, J. Korean Phys. Soc. 39, S228 (2001).
11. Y. S. Yang, S. J. Lee, S. H. Kim, B. G. Chae and M. S. Jang, J. Appl. Phys. 84, 5005 (1998).
12. K. J. Choi, W. C. Shin, J. H. Yang and S. G. Yoon, Appl. Phys. Lett. 75, 722 (1999).
13. H. N. Lee, Y. T. Kim and S. H. Choh, Appl. Phys. Lett. 76, 1066 (2000).
14. Y. S. Yang, M. K. Ryu, H. J. Joo, S. H. Lee, S. J. Lee, K. Y. Kang and M. S. Jang, Appl. Phys. Lett. 76, 3472 (2000).