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Volumn 70, Issue 4, 1997, Pages 458-460

Depletion-type thin-film transistors with a ferroelectric insulator

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CARRIER CONCENTRATION; ELECTRIC PROPERTIES; ELECTRODES; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; SEMICONDUCTOR DOPING; STRONTIUM COMPOUNDS; TIN COMPOUNDS;

EID: 0030853041     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118180     Document Type: Article
Times cited : (91)

References (17)
  • 1
    • 8644224570 scopus 로고    scopus 로고
    • Some device applications of oxidic thin films are described in Mater. Res. Soc. Bull. 21, (1996).
    • (1996) Mater. Res. Soc. Bull. , vol.21
  • 2
    • 0000874241 scopus 로고    scopus 로고
    • H. Lin, N. J. Wu, K. Xie, X. Y. Li, and A. Ignatiev, Appl. Phys. Lett. 65, 953 (1994); Y. Watanabe, ibid. 66, 1770 (1995); C. H. Ahn, J.-M. Triscone, N. Archibald, M. Decroux, R. H. Hammond, T. H. Geballe, O. Fischer, and M. R. Beasley, Science 269, 373 (1995); Z. W. Dong, Z. Trajanovic, T. Boettcher, I. Takeuchi, V. Talyansky, C.-H. Chen, R. Ramesh, and T. Venkatesan (to be published).
    • (1994) Appl. Phys. Lett. , vol.65 , pp. 953
    • Lin, H.1    Wu, N.J.2    Xie, K.3    Li, X.Y.4    Ignatiev, A.5
  • 3
    • 36449008571 scopus 로고
    • H. Lin, N. J. Wu, K. Xie, X. Y. Li, and A. Ignatiev, Appl. Phys. Lett. 65, 953 (1994); Y. Watanabe, ibid. 66, 1770 (1995); C. H. Ahn, J.-M. Triscone, N. Archibald, M. Decroux, R. H. Hammond, T. H. Geballe, O. Fischer, and M. R. Beasley, Science 269, 373 (1995); Z. W. Dong, Z. Trajanovic, T. Boettcher, I. Takeuchi, V. Talyansky, C.-H. Chen, R. Ramesh, and T. Venkatesan (to be published).
    • (1995) Appl. Phys. Lett. , vol.66 , pp. 1770
    • Watanabe, Y.1
  • 4
    • 0029344690 scopus 로고
    • H. Lin, N. J. Wu, K. Xie, X. Y. Li, and A. Ignatiev, Appl. Phys. Lett. 65, 953 (1994); Y. Watanabe, ibid. 66, 1770 (1995); C. H. Ahn, J.-M. Triscone, N. Archibald, M. Decroux, R. H. Hammond, T. H. Geballe, O. Fischer, and M. R. Beasley, Science 269, 373 (1995); Z. W. Dong, Z. Trajanovic, T. Boettcher, I. Takeuchi, V. Talyansky, C.-H. Chen, R. Ramesh, and T. Venkatesan (to be published).
    • (1995) Science , vol.269 , pp. 373
    • Ahn, C.H.1    Triscone, J.-M.2    Archibald, N.3    Decroux, M.4    Hammond, R.H.5    Geballe, T.H.6    Fischer, O.7    Beasley, M.R.8
  • 5
    • 0000874241 scopus 로고    scopus 로고
    • to be published
    • H. Lin, N. J. Wu, K. Xie, X. Y. Li, and A. Ignatiev, Appl. Phys. Lett. 65, 953 (1994); Y. Watanabe, ibid. 66, 1770 (1995); C. H. Ahn, J.-M. Triscone, N. Archibald, M. Decroux, R. H. Hammond, T. H. Geballe, O. Fischer, and M. R. Beasley, Science 269, 373 (1995); Z. W. Dong, Z. Trajanovic, T. Boettcher, I. Takeuchi, V. Talyansky, C.-H. Chen, R. Ramesh, and T. Venkatesan (to be published).
    • Dong, Z.W.1    Trajanovic, Z.2    Boettcher, T.3    Takeuchi, I.4    Talyansky, V.5    Chen, C.-H.6    Ramesh, R.7    Venkatesan, T.8
  • 9
    • 85033290636 scopus 로고    scopus 로고
    • note
    • When charge injection is the cause of the memory effect, the transfer characteristic has a sense of rotation opposite to the sense of rotation of the charge displacement. This is described in Refs. 7 and 8, for example.
  • 11
    • 0016648590 scopus 로고
    • S.-Y. Wu, IEEE Trans. Electron Devices 21, 499 (1974); Ferroelectrics 11, 379 (1976).
    • (1976) Ferroelectrics , vol.11 , pp. 379
  • 14
    • 85033306919 scopus 로고    scopus 로고
    • note
    • Previously, large memory effects were reported in ferroelectric transistors with a bulk constituent, i.e., made of a semiconductor thin film on a ceramic ferroelectric substrate (e.g., Ref. 10) or made of a ferroelectric thin film on a crystalline Si substrate (e.g., Ref. 11). In all-thin-film ferroelectric transistors, memory effects were reported with a remnant on/off ratio slightly above unity (see Refs. 2 and 3) (note that we quoted the results of Watanabe incorrectly in our publication (Ref. 3).


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