Schottky barrier effects in the electronic conduction of sol-gel derived lead zirconate titanate thin film capacitors

Journal of Applied Physics

Volumn 84, Issue 9, 1998, Pages 5005-5011

  Yang, Y S ^a   Lee, S J ^a   Kim, S H ^a   Chae, B G ^a   Jang, M S ^a  

^a Pusan National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC SPACE CHARGE; ELECTRON TRAPS; ELECTRONIC PROPERTIES; FERROELECTRIC MATERIALS; LEAKAGE CURRENTS; SCHOTTKY BARRIER DIODES; SEMICONDUCTING LEAD COMPOUNDS; SOL-GELS; THIN FILM DEVICES; TRANSMISSION ELECTRON MICROSCOPY;

LEAD ZIRCONATE TITANATE; POOLE-FRENKEL EMISSION; THIN FILM CAPACITORS;

CAPACITORS;

EID: 0032209420     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368747     Document Type: Article

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