Ferroelectricity and electronic defect characteristics of c-oriented Sr0.125Ba0.75Nb2O6 thin films deposited on Si substrates

Applied Physics Letters

Volumn 76, Issue 23, 2000, Pages 3472-3474

  Yang, Y S ^a,b   Ryu, M K ^a   Joo, H J ^a   Lee, S H ^a   Lee, S J ^a,c   Kang, K Y ^a,c   Jang, M S ^a  

^a Pusan National University   (South Korea)

^b Korea Research Institute of Chemical Technology   (South Korea)

^c ETR1   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000083863     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126681     Document Type: Article

References (16)

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