Characterization of local piezoelectric behavior of ferroelectric PbZrxTi1-xO3 thin films for application to ultra-high density storage device

Journal of the Korean Physical Society

Volumn 40, Issue 1, 2002, Pages 145-147

  Shin, Jung Gyu ^a   Shin, Hyungjung ^a   Jeon, Jeon Up ^b  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^b University of Ulsan   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036002417     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (12)

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