Thermal stability of Ti and Pt nanowires manufactured by Ga+ focused ion beam

Journal of Microscopy

Volumn 214, Issue 3, 2004, Pages 252-260

  Inkson, B J ^a   Dehm, G ^b   Wagner, T ^b  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Focused ion beam (FIB); Nanoparticles; Nanowires; Pt; Thermal stability; Ti

Indexed keywords

ALUMINA; ALUMINUM OXIDE; FOCUSED ION BEAMS; IONS; MOLECULAR BEAM EPITAXY; NANOWIRES; PLATINUM; SINGLE CRYSTALS; THERMODYNAMIC STABILITY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; WIRE;

FOCUSED ION BEAM; FOCUSED ION BEAM SPUTTERING; FOCUSED IONS BEAMS; ION BEAM DEPOSITION; MOLECULAR-BEAM EPITAXY; PT; PT NANOWIRES; PT THIN FILMS; TI; TI THIN FILMS;

NANOPARTICLES;

GALLIUM; NANOPARTICLE; PLATINUM; TITANIUM;

CONFERENCE PAPER; CRYSTAL STRUCTURE; FOCUSED ION BEAM MICROSCOPY; MICROSCOPY; PRIORITY JOURNAL; TEMPERATURE DEPENDENCE; THERMOSTABILITY; TRANSMISSION ELECTRON MICROSCOPY; VACUUM;

EID: 2942572693     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0022-2720.2004.01344.x     Document Type: Conference Paper

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