Electroluminescence as internal light source for measurement of the photonic strength of random porous GaP

Applied Physics Letters

Volumn 84, Issue 19, 2004, Pages 3852-3854

  Van Driel, A F ^a   Vanmaekelbergh, D ^a   Kelly, J J ^a  

^a UTRECHT UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRODES; ELECTROLUMINESCENCE; ETCHING; INTERFACES (MATERIALS); LIGHT SOURCES; LIGHT TRANSMISSION; PHOTONS; PORE SIZE; POROSITY; REFRACTIVE INDEX;

NONPOROUS MATERIALS; PHOTONIC STRENGTH; RANDOM-SCATTERING MATERIALS;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 2942516644     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1748839     Document Type: Article

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