Predicting the number of fatal soft errors in Los Alamos National Laboratory's ASC Q supercomputer

IEEE Transactions on Device and Materials Reliability

Volumn 5, Issue 3, 2005, Pages 329-335

  Michalak, Sarah E ^b,d   Harris, Kevin W ^a,c   Hengartner, Nicolas W ^b   Takala, Bruce E ^b   Wender, Stephen A ^b  

^a IEEE

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c HEWLETT PACKARD COMPANY   (United States)

^d AMERICAN STATISTICAL ASSOCIATION   (United States)

Author keywords

Cosmic ray induced neutron; Life estimation; Linear accelerators; Memory testing; Neutron beam; Neutron radiation effects; Neutron induced soft error; Semiconductor device radiation effects; Semiconductor device testing; Single event upset; Soft error rate

Indexed keywords

COSMIC-RAY-INDUCED NEUTRON; LIFE ESTIMATION; MEMORY TESTING; NEUTRON RADIATION EFFECTS; NEUTRON-INDUCED SOFT ERROR; SEMICONDUCTOR-DEVICE TESTING; SINGLE-EVENT UPSET; SOFT-ERROR RATE;

COSMIC RAYS; LINEAR ACCELERATORS; NEUTRON BEAMS; NEUTRONS; RADIATION EFFECTS; SEMICONDUCTOR DEVICES;

SUPERCOMPUTERS;

EID: 29344473319     PISSN: 15304388     EISSN: 15304388     Source Type: Journal    
DOI: 10.1109/TDMR.2005.855685     Document Type: Article

References (26)

1. TOP500 List. (Jun. 2003). [Online]. Available: http://top500.org/list/2003/06/?page
2. Compaq Computer Corporation. (2002). AlphaServer ES45 Owners Guide [Online]. Available: http://h18002.www1.hp.com/alphaserver/download/ekes450-ug-b01.pdf
3. R. Kessler, E. McLellan, and D. Webb, The Alpha 21264 Microprocessor Architecture [Online]. Available: http://h18002.www1.hp.com/alphaserver/download/ev6chip.pdf
4. The Message Passing Interface (MPI) Standard. [Online]. Available: http://wwwunix.mcs.anl.gov/mpi/
5. K. W. Harris, "Asymmetries in soft-error rates in a large cluster system," IEEE Trans. Device Mater. Rel., vol. 5, no. 3, pp. 336-342, Sep. 2005.
6. Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices, JEDC standard, JESD89, 2001.
7. M. S. Gordon, P. Goldhagen, K. P. Rodbell et al., "Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground, " IEEE Trans. Nucl. Sci., vol. 51, no. 6, pp. 3427-3434, Dec. 2004.
8. S. A. Wender, "Neutron single event effects testing at LANSCE, " presented at the IEEE Int. Reliability Physics Symp., Dallas, TX, Mar. 30, 2003.
9. C. A. Gossett, B. W. Hughlock, M. Katoozi, G. S. LaRue, and S. A. Wender, "Single event phenomena in atmospheric neutron environments," IEEE Trans. Nucl. Sci., vol. 40, no. 6, pp. 1845-1852, Dec. 1993.
10. E. Normand, D. L. Oberg, J. L. Wert, J. D. Ness, P. P. Majewski et al., "Single event upset and charge collection measurements using high energy protons and neutrons," IEEE Trans. Nucl. Sci., vol. 41, no. 6, pp. 2203-2209, Dec. 1994.
11. E. Normand, "Single event upsets at ground level," IEEE Trans. Nucl. Sci., vol. 43, no. 6, pp. 2742-2750, Dec. 1996.
12. Y. Tosaka, S. Satoh, K. Suzuki, T. Sugii, N. Nakayama et al., "Measurement and analysis of neutron-reaction-induced charges in a silicon surface region," IEEE Trans. Nucl Sci., vol. 44, no. 2, pp. 173-178, Apr. 1997.
13. Y. Tosaka, S. Satoh, T. Itakura, H. Ehara, T. Ueda et al., "Measurement and analysis of neutron-induced soft errors in sub-half-micron CMOS circuits," IEEE Trans. Electron Devices, vol. 45, no. 7, pp. 1453-1458, Jul. 1998.
14. P. Hazucha, C. Svensson, and S. A. Wender, "Cosmic-ray soft error rate characterization of a standard 0.6-μm CMOS process," IEEE J. Solid-State Circuits, vol. 35, no. 10, pp. 1422-1429, Oct. 2000.
15. P. Hazucha and C. Svensson, "Cosmic ray neutrons multiple-upset measurements in a 0.6-μm CMOS process," IEEE Trans. Nucl. Sci., vol. 47, no. 6, pp. 2595-2602, Dec. 2000.
16. T. Granlund, B. Granbom, and N. Olsson, "Soft error rate increase for new generations of SRAMs," IEEE Trans. Nucl. Sci., vol. 50, no. 6, pp. 2065-2068, Dec. 2003.
17. H. Kobayashi, H. Usuki, K. Shiraishi, H. Tsuchiya, N. Kawamoto et al., "Comparison between neutron-induced system-SER and accelerated-SER in SRAMs," in Proc. 42nd Int. Reliability Physics Symp., Phoenix, AZ, 2004, pp. 288-293.
18. T CMOS process," IEEE J. Solid-State Circuits, vol. 39, no. 9, pp. 1536-1543, Sep. 2004.
19. J. F. Ziegler, H. P. Muhlfeld, C. J. Montrose, H. W. Curtis, T. J. O'Gorman et al., "Accelerated testing for cosmic soft-error rate," IBM J. Res. Develop., vol. 40, no. 1, pp. 51-72, Jan. 1996.
20. T. J. O'Gorman, J. M. Ross, A. H. Taber, J. F. Ziegler, H. P. Muhlfeld et al., "Field testing for cosmic ray soft errors in semiconductor memories," IBM J. Res. Develop., vol. 40, no. 1, pp. 41-50, Jan. 1996.
21. S. E. Michalak, K. W. Harris, N. W. Hengartner, B. E. Takala, and S. A. Wender, "Using the LANSCE irradiation facility to predict the number of fatal soft errors in one of the world's fastest supercomputers," in Proc. 18th Int. Conf. Application Accelerators Research and Industry, Fort Worth, TX, 2004, to be published.
22. S. A. Wender, S. Balestrini, A. Brown, R. C. Haight, C. M. Laymon et al., "A fission ionization detector for neutron flux measurements at a spallation source," Nucl. Instrum. Methods Phys. Res., A, vol. 336, no. 1-2, pp. 226-231, 1993.
23. J. T. Daly, "A strategy for running large scale applications based on a model that optimizes the checkpoint interval for restart dumps," in Proc. 1st Int. Workshop Software Engineering High Performance Computing System Applications, Edinburgh, Scotland, 2004, pp. 70-74.
24. _, "Milestone Performances on the Q Machine," Los Alamos Nat. Lab., Los Alamos, NM, Tech. Rep. LA-CP-03-0278, 2003.
25. _, "A higher order estimate of the optimum checkpoint interval for restart dumps," in Future Generation Computing Systems. Amsterdam, The Netherlands: Elsevier, 2004.
26. _, "Evaluating the performance of a checkpointing application given the number and types of interrupts," in Proc. Workshop High Performance Computing Reliability Issues, San Francisco, CA, 2005.