Effects of surface treatment on work function of ITO (Indium Tin Oxide) films

Journal of the Korean Physical Society

Volumn 47, Issue SUPPL. 3, 2005, Pages

  Kim, Chanhyung ^a   Lee, Bongki ^a   Yang, Hee Jung ^a   Lee, Hyun Min ^a   Lee, Jae Gab ^a   Shin, Hyunjung ^a  

^a Kookmin University   (South Korea)

Author keywords

Conducting AFM; Indium tin oxide; Kelvin probe force microscopy; Surface treatment; Work function

Indexed keywords

EID: 29344439699     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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