Temperature dependence of the reflectivity of silicon with surface oxide at wavelengths of 633 and 1047 nm

Applied Physics Letters

Volumn 75, Issue 1, 1999, Pages 43-45

  Heller, J ^a   Bartha, J W ^a   Poon, C C ^b   Tam, A C ^b  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

^b IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042207180     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124271     Document Type: Article

References (10)

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