Bayesian inference in surface physics

Applied Physics A: Materials Science and Processing

Volumn 82, Issue 3 SPEC. ISS., 2006, Pages 403-413

  Toussaint, U V ^a   Dose, V ^a  

^a MAX PLANCK INSTITUT FÜR PLASMAPHYSIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; MATHEMATICAL MODELS; PROBABILITY; RUTHERFORD BACKSCATTERING SPECTROSCOPY;

DATA SETS; SURFACE PHYSICS;

SURFACE CHEMISTRY;

EID: 29144516333     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-005-3360-8     Document Type: Article

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