Depth profile determination with confidence intervals from Rutherford backscattering data

New Journal of Physics

Volumn 1, Issue , 1999, Pages

  Toussaint, U V ^a   Fischer, R ^a   Krieger, K ^a   Dose, V ^a  

^a MAX PLANCK INSTITUT FÜR PLASMAPHYSIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3042855402     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/1/1/311     Document Type: Article

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