Bayesian neural-networks-based evaluation of binary speckle data

Applied Optics

Volumn 43, Issue 28, 2004, Pages 5356-5363

  Toussaint, Udo V ^a   Gori, Silvio ^a   Dose, Volker ^a  

^a MAX PLANCK INSTITUT FÜR PLASMAPHYSIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; DATA REDUCTION; IMAGE PROCESSING; INTERFEROMETERS; MATHEMATICAL MODELS; NEURAL NETWORKS; PROBABILITY; PROBLEM SOLVING; TOKAMAK DEVICES;

FRINGE PATTERN; PHASE CHANGE DISTRIBUTION; SPECKLE INTERFEROMETRY;

LIGHT INTERFERENCE;

EID: 5544226484     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.43.005356     Document Type: Article

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