Influence of layer defects on the damping in ferroelectric thin films

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 348, Issue 3-6, 2006, Pages 397-404

  Wesselinowa, J M ^a   Michael, T ^b   Trimper, S ^b   Zabrocki, K ^b  

^a UNIVERSITY OF SOFIA   (Bulgaria)

^b MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DAMPING; DEFECTS; FERROELECTRIC FILMS; FERROELECTRIC THIN FILMS; FERROELECTRICITY; ISING MODEL;

ANALYTICAL EXPRESSIONS; DAMPING FUNCTION; DIFFERENT THICKNESS; ELEMENTARY EXCITATIONS; GREEN'S FUNCTION TECHNIQUE; INTERACTION STRENGTH; STRUCTURAL DEFECT; TRANSVERSE FIELD;

THIN FILMS;

EID: 29144503979     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physleta.2005.08.044     Document Type: Article

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