X-ray photoelectron spectroscopy and the pattern recognition method - Their application to surface studies in CoPd alloys

Surface and Interface Analysis

Volumn 37, Issue 13, 2005, Pages 1143-1150

  Lesiak, B ^a   Bilinski A ^a   Jozwik A ^b,c  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b INSTITUTE OF BIOCYBERNETICS AND BIOMEDICAL ENGINEERING   (Poland)

^c LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

CoPd alloys; Fuzzy k nearest neighbour rule (fkNN); Pattern recognition method; Surface segregation; X ray induced Auger electron spectroscopy (XAES); X ray photoelectron spectroscopy (XPS)

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COMPOSITION; KINETIC ENERGY; PATTERN RECOGNITION; POLYCRYSTALLINE MATERIALS; SURFACE CHEMISTRY; X RAY PHOTOELECTRON SPECTROSCOPY;

COPD ALLOYS; FUZZY-K NEAREST NEIGHBOR RULE (FK-NN); PATTERN RECOGNITION METHOD; SURFACE SEGREGATION; X-RAY INDUCED AUGER ELECTRON SPECTROSCOPY (XAES);

BINARY ALLOYS;

EID: 29044447503     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.2125     Document Type: Article

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