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Volumn 52, Issue 279, 1996, Pages 99-102

Application of the pattern recognition method to electron spectroscopies (AES and XPS)

Author keywords

[No Author keywords available]

Indexed keywords


EID: 4444379139     PISSN: 12660167     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (17)
  • 8
    • 0011206119 scopus 로고
    • Application of the Pattern Recognition Method in Auger Electron Spectroscopy, Springer-Verlag Series in Surface Science 18
    • Eds. Cubiotti, G. Mondio, K. Wandelt, Springer, Berlin
    • B. Lesiak, A. Jablonski, Application of the Pattern Recognition Method in Auger Electron Spectroscopy, Springer-Verlag Series in Surface Science 18. Auger Spectroscopy and Electronic Structure Eds. Cubiotti, G. Mondio, K. Wandelt, (Springer, Berlin, 1989), p. 198.
    • (1989) Auger Spectroscopy and Electronic Structure , pp. 198
    • Lesiak, B.1    Jablonski, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.