Segregation in CuPd alloys studied by X-ray photoelectron spectroscopy using lineshape analysis by the fuzzy k-nearest neighbour rule

Polish Journal of Chemistry

Volumn 79, Issue 8, 2005, Pages 1365-1378

  Lesiak, B ^a   Bilinski A ^b   Jozwik A ^c  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b INSTITUTE OF BIOCYBERNETICS AND BIOMEDICAL ENGINEERING   (Poland)

^c LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

CuPd alloys; fkNN; Multiline (ML) approach; Pattern recognition; Quantitative and qualitative analyses; Segregation; The fuzzy k nearest neighbour rule

Indexed keywords

EID: 24644489259     PISSN: 01375083     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (35)

1. Loboda-Cackovic J. and Block J.H., Vacuum, 46, 1449 (1995).
2. Loboda-Cackovic J., Vacuum, 48, 913 (1997).
3. Newton M.A., Francis S.M., Li Y., Law D. and Bowker M., Surf. Sci., 259, 45 (1991).
4. Newton M.A. and Bowker M., Surf. Sci., 307-309, 445 (1994).
5. Nieuwenhuys B.E., Surf. Rev. Lett., 3, 1869 (1996).
6. Dumas P., Suhren M., Chabal Y.T., Hirschmal C.J. and Williams G.P., Surf. Sci., 371, 200 (1997).
7. Deubage Y., Abon M., Bertolini J.C., Massardier J. and Rochefort A., Appl. Surf. Sci., 90, 15 (1995).
8. Lopez N. and Nørskov J.K., Surf. Sci., 477, 59 (2001).
9. Gijeman O.L.J., Surf. Sci., 150, 1 (1985).
10. Bozzolo G., Garcés J.E., Noebe R.D., Abel P. and Mosca H.O., Prog. Surf. Sci., 73, 79 (2003).
11. Bergmans R.H., van der Grift M., Denier van der Gon A.W. and Brongersma H.H., Surf. Sci., 345, 303 (1996).
12. Barnes C.J., AlShamaileh E., Pitkänen T., Kaukasoina P. and Lindroos M., Surf. Sci., 492, 55 (2001).
13. Murray P.W., Stensgaard I., Laegsgaard E. and Besenbacher F., Surf. Sci., 365, 591 (1996).
14. Bach Aaen A., Laegsgaard E., Ruban A.V. and Stensgaard I., Surf. Sci., 408, 43 (1998).
15. Pussi K., Lindroos M., AlShamaileh E. and Barnes C.J., Surf. Sci., 513, 555 (2002).
16. Bennett R.A., Poulston S., Price N.J., Reilly J.P., Stone P., Barnes C.J. and Bowker M., Surf. Sci., 433-435, 816 (1999).
17. Jablonski A., Polish J. Chem., 74, 1533 (2000).
18. Jablonski A., Lesiak B., Zommer L., Ebel M.F., Ebel H., Fukuda Y., Suzuki Y. and Tougaard S., Surf. Interface Anal., 21, 724 (1994).
19. Goto K., Ishikawa K., Wolfe R.G. and Grant J.T., Appl. Surf. Sci., 3, 211 (1979).
20. Ichimura S., Koshikawa T., Sekine T., Goto K. and Shimizu H., Surf. Interface Anal., 11, 94 (1988).
21. Kurokawa A., Shimizu R., Kubota Y. and Kang H.J., Surf. Interface Anal., 14, 388 (1989).
22. Jansson C. and Morgen P., Surf. Interface Anal., 15, 1 (1990).
23. Lesiak B., Vide, 52, 99 (1996).
24. Lesiak B., Zemek J. and Jóźwik A., Appl. Surf. Sci., 135, 318 (1998).
25. Lesiak B. and Jóźwik A., Surf. Interface Anal., 36, 793 (2004).
26. Jurs P.C. and Isenhour T.L., Chemical Application of Pattern Recognition. Wiley and Sons Ltd., N.Y. 1975.
27. Duda O.R., Hart P.E. and Stork D.G., Pattern Classification. A Wiley Interscience Publication, 2001.
28. Fix E. and Hodges J.L., Discriminatory Analysis: Nonparametric Discrimination Small Sample Performance, project 21-49-004, Report Number 11, USAF School of Aviation Medicine, Randolph Field, Texas, 1952, p. 280-322.
29. Jóźwik A., Pattern Recognition Letters, 1, 287 (1983).
30. Bezdek J.C., Chuah S.K. and Leep D., Fuzzy Sets and Systems, 237, 18 (1986).
31. Yamamura Y. and Tawara H., Energy Dependence of Ion-induced Sputtering Yields from Monoatomic Solids at Normal Incidence, Atomic Data and Nuclear Data Tables, 149, 199, 218 (1996).
32. Moulder J.F., Stickle W.F., Sobol P.E. and Bomben K.D., Handbook of X-ray Photoelectron Spectroscopy. A Reference Book of Standard Spectra for Identification and Interpretation of XPS Data. Chastain J. eds., Perkin-Elmer Corporation. Physical Electronics Division. Minnesota 55344, USA, 1992.
33. Watts F.J. and Wolstenholme J., An Introduction to Surface Analysis by XPS and AES. J. Wiley and Sons Ltd., 2003.
34. Tanuma S., Powell C.J. and Penn D.R., Surf. Interface Anal., 21, 165 (1994).
35. Jablonski A., Tilinin I.S. and Powell C.J., Phys. Rev. B, 54, 10927 (1996).