XPS study of Pd/Co multilayers: Identification of Pd and Co interface bonding states by pattern recognition methods

Surface Science

Volumn 346, Issue 1-3, 1996, Pages 79-90

  Lesiak, B ^a   Zemek, J ^b   De Haan, P ^c   Jozwik, A ^d  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b INSTITUTE OF PHYSICS   (Czech Republic)

^c UNIVERSITY OF TWENTE   (Netherlands)

^d INSTITUTE OF BIOCYBERNETICS AND BIOMEDICAL ENGINEERING   (Poland)

Author keywords

Cobalt; Palladium; X ray photoelectron spectroscopy

Indexed keywords

ALGORITHMS; COBALT; FUZZY SETS; INTERFACES (MATERIALS); MAGNETIC ANISOTROPY; MAGNETIC MATERIALS; PALLADIUM; PATTERN RECOGNITION; X RAY PHOTOELECTRON SPECTROSCOPY;

CLUSTERIZATION; K NEAREST NEIGHBOR RULE; NEAREST NEIGHBOR RULE; SURFACE EFFECTS;

MULTILAYERS;

EID: 0030084885     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)00918-3     Document Type: Article

References (34)

1. F.J.A. den Breeder, W. Howing and P.J.H. Bloemen, J. Magn. Magn. Mater. 93 (1991) 562.
2. P.F. Carcia, J. Appl. Phys. 66 (1988) 5066.
3. P.F. Carcia, A.D. Meinhaldt and A. Suna, Appl. Phys. Lett. 47 (1985) 178.
4. B.N. Engel, C.D. England, R.A. Van Leeuwen, M.H. Wiedmann and C.M. Falco, Phys. Rev. Lett. 67 (1991) 1910.
5. Z. Simša, J. Zemek, J. Simšová, P. de Hann and C. Lodder, IEEE Trans. Magn. 30 (1994) 951.
6. J. Šimšová and R. Gemperle, IEEE Trans. Magn. 30 (1994) 784.
7. V. Kambersky', P. de Haan, J.C. Lodder, J. Šimšová and R. Gemperle, IEEE Trans. Magn. 29 (1993) 3138.
8. Z.S. Shan, P. He, C. Moore, J. Woollam and D.J. Sellmyer, J. Appl. Phys. 73 (1993) 6057.
9. G. Guntherodt, B. Hillebrands, P. Krams, J.V. Harzer, F. Lauks, R.L. Stamps, W. Weber, D. Hartmann, D.A. Wesner, A. Rampe, U.A. Effner, H.P. Oepen, D. Weller, R.F.C. Farrow, B.N. Engel and C.M. Falco, Phil. Mag. B 70 (1994) 767.
10. D. Briggs and M.P. Seah, Eds., Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, 1st ed. (Wiley, Chichester, 1983).
11. P.M.A. Sherwood, in: Practical Surface Analysis, 2nd edn., Eds. D. Briggs and M.P. Seah (Wiley, Chichester, 1990) p. 555.
12. B. Lesiak, P. Mrozek, A. Jablonski and A. Jozwik, Surf. Interface Anal. 6 (1986) 121.
13. B. Lesiak, A. Jablonski, M. Zagorska and A. Jozwik, Surf. Interface Anal. 12 (1988) 461.
14. B. Lesiak, A. Jablonski, M.U. Kisliuk, M. Zagorska and A. Jozwik, Poverkhnost N11 (1989) 39.
15. B. Lesiak and A. Jablonski, in: Application of the Pattern Recognition Method in Auger Electron Spectroscopy, Springer Series in Surface Science 18, Auger Spectroscopy and Electronic Structure, Eds. Cubiotti, G. Mondio and K. Wandelt (Springer, Berlin, 1989) p. 198.
16. B. Lesiak, A. Jablonski, W. Palczewska, I. Kulszewicz-Bajer and M. Zagorska, Surf. Interface Anal. 18 (1992) 403.
17. B. Lesiak, A. Jablonski, W. Palczewska, I. Kulszewicz-Bajer and M.U. Kisliuk, Polish J. Chem. 68 (1994) 377.
18. B. Lesiak, A. Jablonski, W. Palczewska, I. Kulszewicz-Bajer and M.U. Kisliuk, Polish J. Chem. 69 (1995) 141.
19. J. Zemek, B. Lesiak-Orlowska and A. Jablonski, Prog. Surf. Sci. 35 (1991) 79.
20. J. Zemek, B. Lesiak-Orlowska and A. Jablonski, J. Electron Spectrosc. Relat. Phenom. 60 (1992) 13.
21. J. Zemek, T. Vystrcil, B. Lesiak-Orlowska and A. Jablonski, Appl. Surf. Sci. 70/71 (1993) 299.
22. J. Zemek, T. Vystrcil, B. Lesiak-Orlowska, A. Jablonski and A. Luches, Surf. Interface Anal. 21 (1994) 771.
23. A. Jablonski, L. Zommer, B. Lesiak and A. Bilinski, Surf. Interface Anal. 22 (1994) 41.
24. P.A. Devijver and J. Kittler, Pattern Recognition: A Statistical Approach (Prentice Hall, London, 1982).
25. A. Jablonski, B. Lesiak, L. Zommer, M.F. Ebel, H. Ebel, Y. Fukuda, Y. Suzuki and S. Tougaard, Surf. Interface Anal. 21 (1994) 724.
26. H.E. Roosendaal, in: Sputtering by Particle Bombardment I, Physical Sputtering of Single-Element Solids, Topics in Applied Physics, Eds. R. Behrisch, Vol.47 (Springer, Berlin, 1981) pp. 174; 179.
27. J.F. Moulder, W.F. Stickle, P.E. Sobol and K.D. Bomben, in: Handbook of X-ray Photoelectron Spectroscopy: A Reference Book of Standard Spectra for Identification and Interpretation of XPS Data, Ed. J. Chastain (Perkin-Elmer Corporation, Physical Electronic Division, 1992).
28. S.K. Pal and D.K. Dutta Majumder, Eds., Fuzzy Mathematical Approach to Pattern Recognition (Halsted Press, New York, 1986).
29. A. Jablonski and H. Ebel, Surf. Interface Anal. 11 (1988) 627.
30. A. Jablonski and J. Zemek, Phys. Rev. B 48 (1993) 4799.
31. A. Jablonski and C.J. Powell, Surf. Interface Anal. 20 (1993) 771; ASTM Standard E673-93, 1994 Annual Book of ASTM Standards (ASTM, Philadelphia, 1994) p. 739.
32. A. Jablonski and C.J. Powell, Surf. Interface Anal. 20 (1993) 771; ASTM Standard E673-93, 1994 Annual Book of ASTM Standards (ASTM, Philadelphia, 1994) p. 739.
33. M. Krawczyk, L. Zommer, B. Lesiak and A. Jablonski, to be published.
34. S. Tanuma, C.J. Powell and D.R. Penn, Surf. Interface Anal. 17 (1991) 911.