Ferroelectric and piezoelectric properties of highly oriented Pb(Zr,Ti)O3 film grown on Pt/Ti/SiO2/Si substrate using conductive lanthanum nickel nitrate buffer layer

Journal of Materials Research

Volumn 20, Issue 3, 2005, Pages 726-733

  Choi, Jong Jin ^a   Park, Gun Tae ^a   Park, Chee Sung ^a   Kim, Hyoun Ee ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE MATERIALS; CRYSTAL ORIENTATION; DEPOSITION; ELECTRON DIFFRACTION; FERROELECTRICITY; FILM GROWTH; LANTHANUM COMPOUNDS; PIEZOELECTRICITY; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; TEXTURES; X RAY DIFFRACTION ANALYSIS;

CONDUCTIVE BUFFER LAYER; ELECTRON BEAM BACKSCATTERED DIFFRACTION; LANTHANUM NICKEL NITRATE;

LEAD COMPOUNDS;

EID: 29044440210     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2005.0087     Document Type: Article

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