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Volumn 106, Issue 2, 2006, Pages 57-65
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Microarrays of near-field optical probes with adjustable dimensions
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Author keywords
Diffraction; Far field characterization; Near field imaging array; Optical fiber bundle
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Indexed keywords
DATA REDUCTION;
ELECTROMAGNETIC WAVE DIFFRACTION;
IMAGING SYSTEMS;
OPTICAL DEVICES;
OPTICAL FIBERS;
PROBES;
SCANNING ELECTRON MICROSCOPY;
FAR-FIELD CHARACTERIZATION;
NEAR-FIELD IMAGING ARRAY;
OPTICAL FIBER BUNDLE;
ARRAYS;
ARTICLE;
DIFFRACTION;
FIBER OPTICS;
IMAGING SYSTEM;
MECHANICAL PROBE;
METHODOLOGY;
OPTICS;
RADIUS;
SCANNING ELECTRON MICROSCOPY;
SCANNING NEAR FIELD OPTICAL MICROSCOPY;
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EID: 28844460364
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2005.06.060 Document Type: Article |
Times cited : (5)
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References (35)
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