On the spatial resolution of uncoated optical-fiber probes in internal reflection near-field scanning optical microscopy

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 379-382

  Atia, Walid A ^a   Pilevear, Saeed ^a   Güngör, Ali ^b   Davis, Christopher C ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b ULUDAG UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPES; PROBES; REFLECTION; SILICON WAFERS;

NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL FIBER PROBES;

OPTICAL MICROSCOPY;

CHROMIUM; SILICON;

ARTICLE; FLUORESCENCE; IMAGE QUALITY; MICROSCOPY; OPTICS; SCANNING NEAR FIELD OPTICAL MICROSCOPY; STANDARD;

EID: 0032033815     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00090-9     Document Type: Article

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