Structural disordering in WC thin films induced by SiC additions

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 36, Issue 11, 2005, Pages 3055-3063

  Krzanowski, James E ^a   Wormwood, Jonathan ^a  

^a University of New Hampshire   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CRYSTALLINE MATERIALS; ELASTIC MODULI; HARDNESS; METALLOGRAPHIC MICROSTRUCTURE; PHASE SEPARATION; SILICON CARBIDE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

FILM HARDNESS; STRUCTURAL DISORDERING;

TUNGSTEN CARBIDE;

EID: 28444465169     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-005-0077-4     Document Type: Article

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