Defects, yield, and design in sublithographic nano-electronics

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2005, Pages 3-11

  Tahoori, Mehdi B ^a  

^a NORTHEASTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILDING BLOCKS; DESIGN AUTOMATION; MOLECULAR CROSSBARS; TOLERANT FLOW;

AUTOMATION; LITHOGRAPHY; MOLECULAR DYNAMICS; NANOTECHNOLOGY; SELF ASSEMBLY; VLSI CIRCUITS;

MICROELECTRONICS;

EID: 28444440223     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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