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Volumn 495, Issue 1-2, 2006, Pages 86-91
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Comparison of lanthanum substituted bismuth titanate (BLT) thin films deposited by sputtering and pulsed laser deposition
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Author keywords
Aurivillius phase; BLT oxide; PLD; PVD magnetron; Thin films deposition
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Indexed keywords
BISMUTH COMPOUNDS;
ELLIPSOMETRY;
FILM GROWTH;
MAGNETRON SPUTTERING;
MIXTURES;
PULSED LASER DEPOSITION;
REFRACTIVE INDEX;
SCANNING ELECTRON MICROSCOPY;
TITANATE MINERALS;
X RAY DIFFRACTION;
X RAY PHOTOELECTRON SPECTROSCOPY;
AURIVILLIUS PHASE;
BLT OXIDE;
PVD MAGNETRON;
THIN FILMS DEPOSITION;
THIN FILMS;
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EID: 28044458990
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2005.08.154 Document Type: Conference Paper |
Times cited : (31)
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References (18)
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