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Surface and Interface Analysis

Volumn 33, Issue 5, 2002, Pages 410-413

Experimental estimation of surface excitation parameter for surface analysis

(7) Gergely, G a Menyhard, M a Gurban, S a Sulyok, A a Toth, J b Varga, D b Tougaard, S c

a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE (Hungary)

b INSTITUTE OF EXPERIMENTAL MEDICINE (Hungary)

c UNIVERSITY OF SOUTHERN DENMARK (Denmark)

Author keywords

EPES; Experiments; REELS; Surface excitation

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BACKSCATTERING; ELECTRON EMISSION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; KINETIC ENERGY; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING SILICON; SPECTRUM ANALYSIS; SURFACE PLASMON RESONANCE;

SURFACE EXCITATIONS; SURFACE LOSSES;

SURFACE PHENOMENA;

EID: 0036573214 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1224 Document Type: Article

Times cited : (23)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.