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Surface Science

Volumn 597, Issue 1-3, 2005, Pages 65-79

AFM tip induced formation of nanometer scale structures on WSe2 under defined conditions

(4) Jaeckel, B a Gassenbauer, Y a Jaegermann, W a Tomm, Y b

a DARMSTADT UNIVERSITY OF TECHNOLOGY (Germany)

b HAHN MEITNER INSTITUT (Germany)

Author keywords

AFM; Electrochemical nanotechnology; Force distance curves; Layered semiconductors; STM

Indexed keywords

ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; SURFACE ROUGHNESS;

ELECTROCHEMICAL NANOTECHNOLOGY; FORCE-DISTANCE-CURVES; LAYERED SEMICONDUCTORS; STM;

TUNGSTEN COMPOUNDS;

EID: 27944465756 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2004.05.147 Document Type: Article

Times cited : (7)

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