메뉴 건너뛰기




Volumn , Issue , 2005, Pages 129-134

N-detection under transparent-scan

Author keywords

N detection test sets; Scan design; Test generation

Indexed keywords

CLOCKS; COMBINATORIAL MATHEMATICS; SCANNING; TRANSPARENCY;

EID: 27944443205     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/dac.2005.193786     Document Type: Conference Paper
Times cited : (2)

References (11)
  • 1
    • 0029510949 scopus 로고
    • An experimental chip to evaluate test techniques experiment results
    • S. C. Ma, P. Franco and E. J. McCluskey, "An Experimental Chip to Evaluate Test Techniques Experiment Results", in Proc. Intl. Test Conf., 1995, pp. 663-672.
    • (1995) Proc. Intl. Test Conf. , pp. 663-672
    • Ma, S.C.1    Franco, P.2    McCluskey, E.J.3
  • 2
    • 0029215035 scopus 로고
    • On the decline of testing efficiency as the fault coverage approaches 100%
    • April
    • L.-C. Wang, M. R. Mercer and T. W. Williams, "On the Decline of Testing Efficiency as the Fault Coverage Approaches 100%", in Proc. VLSI Test Symp., April 1995, pp. 74-83.
    • (1995) Proc. VLSI Test Symp. , pp. 74-83
    • Wang, L.-C.1    Mercer, M.R.2    Williams, T.W.3
  • 5
    • 0032184442 scopus 로고    scopus 로고
    • Test sequences to achieve high defect coverage for synchronous sequential circuits
    • Oct.
    • I. Pomeranz and S. M. Reddy, "Test Sequences to Achieve High Defect Coverage for Synchronous Sequential Circuits", IEEE Trans. on Computer-Aided Design, Oct. 1998, pp. 1017-1029.
    • (1998) IEEE Trans. on Computer-aided Design , pp. 1017-1029
    • Pomeranz, I.1    Reddy, S.M.2
  • 6
    • 0032638329 scopus 로고    scopus 로고
    • REDO - Random excitation and deterministic observation - First commercial experiment
    • M. R. Grimaila, S. Lee et. al., "REDO - Random Excitation and Deterministic Observation - First Commercial Experiment", in Proc. VLSI Test Symp., 1999, pp. 268-274.
    • (1999) Proc. VLSI Test Symp. , pp. 268-274
    • Grimaila, M.R.1    Lee, S.2
  • 7
    • 0035684196 scopus 로고    scopus 로고
    • Multiple-output propagation transition fault test
    • C.-W. Tseng and E. J. McCluskey, "Multiple-Output Propagation Transition Fault Test", in Proc. Intl. Test Conf., 2001, pp. 358-366.
    • (2001) Proc. Intl. Test Conf. , pp. 358-366
    • Tseng, C.-W.1    McCluskey, E.J.2
  • 10
    • 8344240295 scopus 로고    scopus 로고
    • A new approach to test generation and test compaction for scan circuits
    • March
    • I. Pomeranz and S. M. Reddy, "A New Approach to Test Generation and Test Compaction for Scan Circuits", in Proc. Design Automation and Test in Europe Conf., March 2003, pp. 1000-1005.
    • (2003) Proc. Design Automation and Test in Europe Conf. , pp. 1000-1005
    • Pomeranz, I.1    Reddy, S.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.