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Volumn 98, Issue 8, 2005, Pages

Formation rates of iron-acceptor pairs in crystalline silicon

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE SILICON; DOPANT SPECIES; IRON-ACCEPTOR PAIRS;

EID: 27744486765     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2102071     Document Type: Article
Times cited : (55)

References (24)
  • 16
    • 0004192386 scopus 로고    scopus 로고
    • Springer Series in Material Science, Vol. Springer-Verlag, Berlin
    • K. Graff, Metal Impurities in Silicon-Device Fabrication, Springer Series in Material Science, Vol. 2 (Springer-Verlag, Berlin, 2000).
    • (2000) Metal Impurities in Silicon-Device Fabrication , vol.2
    • Graff, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.