SCOPUS 정보 검색 플랫폼

Volumn 24, Issue 6, 2004, Pages 1149-1152

A study of the electronic states of NixMn3-xO 4+δ thin films using scanning tunneling microscopy and current imaging tunneling spectroscopy

Author keywords

Nickel manganate; NTCR; Spinel; STS; Variable range hopping

Indexed keywords

ANNEALING; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ELECTRONIC STATES;

NICKEL COMPOUNDS;

CERAMICS; FILM; MICROSCOPY; SPECTROSCOPY;

EID: 0942278186 PISSN: 09552219 EISSN: None Source Type: Journal
DOI: 10.1016/S0955-2219(03)00586-7 Document Type: Article

Times cited : (9)

References (9)

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